| 扫描近场光学显微镜对纳米结构的观察 |
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| 引用本文： | 汤鸣,欧阳敏,蔡生民,薛增泉,刘忠范.扫描近场光学显微镜对纳米结构的观察[J].物理化学学报,1997,13(7):669-672. |
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| 作者姓名： | 汤鸣 欧阳敏 蔡生民 薛增泉 刘忠范 |
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| 作者单位： | College of Chemistry and Molecular Engineering,Peking University,Beijing 100871;Department of Electronics,Peking University,Beijing 100871 |
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| 基金项目： | 国家攀登计划，国家杰出人材基金 |
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| 摘 要： | 光学显微镜在人们认识微观世界的过程中一直扮演着非常重要的角色．随着认识的深入，对空间分辨率的要求也越来越高．但是众所周知，普通光学显微镜（远场情况下）的分辨率受光的衍射效应所限制，一般可表达为0．61A／N．A．（约等于A／2，A为照射光的波长，N．A．为数值孔径）
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| 关 键 词： | 近场光学 扫描近场光学显微镜 纳米粒子 |
| 收稿时间： | 1997-01-21 |
| 修稿时间： | 1997-04-25 |
Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope (SNOM) |
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| Tang Ming, Ouyang Min, Cai Sheng Min, Xue Zengquan, Liu Zhongfan.Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope (SNOM)[J].Acta Physico-Chimica Sinica,1997,13(7):669-672. |
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| Authors: | Tang Ming Ouyang Min Cai Sheng Min Xue Zengquan Liu Zhongfan |
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| Affiliation: | College of Chemistry and Molecular Engineering,Peking University,Beijing 100871;Department of Electronics,Peking University,Beijing 100871 |
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| Abstract: | A polydiacetylene nanocrystalline film has been fabricated using surface evaporationmethod and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope(SNOM) system. The SNOM images of this film together with the standard testing Al sampleindicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength,488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated. |
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| Keywords: | Near-field Optics SNOM Nanocrystalline |
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