Structural properties of 0.65Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides |
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| Authors: | Ji Hye Lee Mi Ri Choi William Jo Ji Young Jang Mi Young Kim |
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| Affiliation: | aDepartment of Physics, Ewha Womans University, Seoul 120-750, Republic of Korea;bSchool of Materials Science and Engineering, Seoul National University, Seoul 151-742, Republic of Korea |
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| Abstract: | Coating of 0.65Pb(Mg1/3Nb2/3)O3–0.35PbTiO3 (PMN–PT) relaxor ferroelectrics by a sol–gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN–PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN–PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed. |
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| Keywords: | Scanning probe microscopy PMN– PT Relaxor ferroelectrics TEM |
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