Investigation of the limit of lateral beam shifts on a symmetrical metal-cladding waveguide |
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Authors: | Chen Lin Zhu Yi-Ming Zhang Da-Wei Cao Zhuang-Qi and Zhuang Song-Lin |
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Affiliation: | Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China; Guided Wave Photonics Group, Shanghai Jiao Tong University, Shanghai 200240, China |
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Abstract: | This paper reports that Goos--H\"anchen (GH) shifts
occurring on a symmetrical metal-cladding waveguide are
experimentally identified. It was found that there exists a critical
thickness of the upper metal layer, h_cr, above which negative
shift is observed and, reversely, positive shift occurs. Both
positive and negative GH shifts near the critical thickness do not vary
dramatically and can achieve a maximum on the submillimeter scale, which
is different from simulated results using the stationary-phase
method. It also shows that this critical thickness, h_cr, can be
obtained at the position for zero reflectivity by setting the
intrinsic damping to be the same as the radiative damping. The GH
effects observed near the critical thickness are produced by extreme
distortion of the reflected beam profiles, which limits the
amplitude of the GH shift and, further, the sensitivity of the GH optical
sensor based on the symmetrical metal-cladding waveguide. |
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Keywords: | Goos--H\"anchen shift symmetrical metal-cladding
waveguide optical sensing |
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