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Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak
引用本文:肖维文 刘泽田 丁玄同 石中兵 Vladimir ZHURAVLEV. Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak[J]. 等离子体科学和技术, 2006, 8(2): 133-136
作者姓名:肖维文 刘泽田 丁玄同 石中兵 Vladimir ZHURAVLEV
作者单位:[1]Southwestern Institute of Physics, Chengdu 610041, China [2]Kurchatov Institute of Atomic Energy, Moscow, Russia
基金项目:supported by National Natural Science Foundation of China (No. 10335060)
摘    要:A modulated microwave reflectometry has been successfully developed on HL-2A, which can be used to measure the plasma density profile with time-delay method. This microwave reflectometry has two frequency ranges (26.5 to 40 GHz and 40 to 60 GHz) and it is suitable for measuring the plasma density ranging from 0.8×10^13 cm^-3 to 4.5×10^13 cm^-3. The temporal resolution is i ms and the spatial resolution is about 1 cm. This paper will present the basic principle of the microwave reflectometry, parameters calibration of the equipment and the experimental results on HL-2A tokamak.

关 键 词:反射计 时间延迟 密度轮廓 微波 等离子测量
收稿时间:2005-01-18
修稿时间:2005-01-18

Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak
XIAO Weiwen, LIU Zetian, DING SHI Zhongbing,DING Xuantong, Vladimir ZHURAVLEV. Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak[J]. Plasma Science & Technology, 2006, 8(2): 133-136
Authors:XIAO Weiwen   LIU Zetian   DING SHI Zhongbing  DING Xuantong   Vladimir ZHURAVLEV
Abstract:
Keywords:reflectometry   time-delay   density profile
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