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Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction
Affiliation:1. Aix Marseille Univ, Université de Toulon, CNRS, LIS, Marseille, France;2. FCLAB Research Federation, FR CNRS 3539, University of Franche-Comte, 90010 Belfort Cedex, France;1. State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, China;2. Faculty of Mechanical Engineering, Opole University of Technology, Opole 45-758, Poland;3. Department of Naval Architecture, Ocean, and Marine Engineering, University of Strathclyde, Glasgow G11XQ, United Kingdom;5. Yonsei Frontier Lab, Yonsei University, Seoul 03722, South Korea
Abstract:
Keywords:Insulated Gate Bipolar Transistor  Remaining useful lifetime  Optimal scale Gaussian process  Ant Lion Optimizer
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