首页 | 官方网站   微博 | 高级检索  
     


Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope
Authors:Arsen Babajanyan  Harutyun Melikyan  Jerome Carnis  Youngwoon Yoon  Hanju Lee  Hyung Keun Yoo  Kiejin Lee  Barry Friedman
Affiliation:1. Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea;2. Department of Physics, Sam Houston State University, Huntsville, TX 77341, USA
Abstract:Direct probing of the conductivity distribution in organic materials is motivated by the need to obtain a deeper understanding of carrier behavior in organic thin-film transistors (OTFT), organic electro-luminescent devices, organic photoconductors, and organic biosensors. Here we used a near-field scanning microwave microscope to visualize conductivity profiles in OTFT channel. Applying this technique to pentacene field-effect transistors has revealed changes of the conductivity distribution in the channel arising from the development and exhaustion of an accumulated charge region. The electric field profiles, the complementary image of conductivity profiles, which are visualized by using an optical second harmonic generation method, support the results. We anticipate that direct observation by this microwave method will find wide application in measurement of carrier conductivity in organic and nonorganic materials.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号