Microwave dielectric characteristics of ceramics in Mg2SiO4–Zn2SiO4 system |
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Authors: | KX Song XM Chen CW Zheng |
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Affiliation: | aDepartment of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, China |
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Abstract: | (Mg1?xZnx)2SiO4 ceramics were prepared and characterized. The densification temperatures of the present ceramics are much lower than those for Mg2SiO4 and Zn2SiO4 end-members. Small solid solution limits of Zn in Mg2SiO4 and Mg in Zn2SiO4 are observed, and the bi-phase structure is confirmed in (Mg1?xZnx)2SiO4 ceramics with x = 0.1–0.9. Even though, it is clear that the Qf value of Zn2SiO4 ceramics can be significantly improved together with a suppressed temperature coefficient of resonant frequency τf by substituting Mg for Zn. (Mg0.4Zn0.6)2SiO4 ceramics indicate a good combination of microwave dielectric characteristics: r = 6.6 Qf = 95,650 GHz, and τf = ?60 ppm/°C. |
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Keywords: | A Sintering B X-ray methods C Dielectric properties E Functional application |
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