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75kA导流槽磁场及其引起的铝液流场模拟分析
引用本文:李相鹏,李劼,赖延清,刘业翔,冉永华,周昊,岑可法.75kA导流槽磁场及其引起的铝液流场模拟分析[J].中国有色金属学报,2007,17(5):813-818.
作者姓名:李相鹏  李劼  赖延清  刘业翔  冉永华  周昊  岑可法
作者单位:1. 浙江大学,能源清洁利用国家重点实验室,杭州,310027;中南大学,冶金科学与工程学院,长沙,410083
2. 中南大学,冶金科学与工程学院,长沙,410083
3. 昆山铝业有限公司,昆山,215313
4. 浙江大学,能源清洁利用国家重点实验室,杭州,310027
基金项目:国家重点基础研究发展计划(973计划);湖南省自然科学基金
摘    要:以商用有限元计算软件ANSYS为计算平台,对75kA导流型铝电解槽电磁场和电磁力场分布及其对铝液流动和波动的影响进行了模拟计算。结果表明:阴极斜坡表面电磁场和电磁力场分布基本呈沿电解槽长轴对称分布,且电磁力与重力方向相同,这有利于阴极表面电磁力向聚铝沟排放,而在电磁力作用下,聚铝沟内铝液波动最大幅度为0.021m,仍保持在安全范围之内,不会引起两极短路现象的发生,表明在现有75kA普通预焙槽母线配置方案下,可以维持导流型结构电解槽的正常运行。

关 键 词:导流型铝电解槽  磁场  电磁力  有限元方法
文章编号:1004-0609(2007)05-0813-06
收稿时间:2006-09-08
修稿时间:2007-01-24

Simulation and analysis of magnetic fields and flow fields of metal pad in 75 kA drained style aluminum reduction cell
LI Xiang-peng,LI Jie,LAI Yan-qing,LIU Ye-xiang,RAN Yong-hua,ZHOU Hao,CEN Ke-fa.Simulation and analysis of magnetic fields and flow fields of metal pad in 75 kA drained style aluminum reduction cell[J].The Chinese Journal of Nonferrous Metals,2007,17(5):813-818.
Authors:LI Xiang-peng  LI Jie  LAI Yan-qing  LIU Ye-xiang  RAN Yong-hua  ZHOU Hao  CEN Ke-fa
Affiliation:1. State Key Laboratory of Clean Energy Utilization, Zhejiang University, Hangzhou 310027, China; 2. School of Metallurgical Science and Engineering, Central South University, Changsha 410083, China; 3. Kunshan Aluminium Co Ltd, Kunshan 215313, China
Abstract:Numerical simulations was conducted based on the commercial finite element method software package ANSYS to study the influences of electromagnetic field and electromagnetic force distribution on flow fields and fluctuations of the molten metal in a 75 kA drained cell. The results show that, the distribution of magnetic field and lelectromagnetic force in the aluminum film on the cathode slope are in symmetry to the long axis of the cell, especially the magnetic force is in the same direction as the gravity force, which is in favor of the aluminum discharging from the cathode slope. The highest fluctuation of aluminum pad surface in the accumulation sump is 0.021 m, which still remains within the safe range, and will not cause interpolar short circuit, so a normal operation process could be maintained with the same bus bar configuration as the current 75 kA aluminum reduction cells.
Keywords:drained style aluminum reduction cell  magnetic fields  electromagnetic force  finite element method
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