First-principles calculations and experimental study of enhanced nonlinear and dielectric properties of Sn4+-doped CaCu2.95Mg0.05Ti4O12 ceramics |
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| Authors: | Jakkree Boonlakhorn Bundit Putasaeng Pinit Kidkhunthod Jedsada Manyam Sriprajak Krongsuk Pornjuk Srepusharawoot Prasit Thongbai |
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| Affiliation: | 1. Giant Dielectric and Computational Design Research Group (GD–CDR), Department of Physics, Faculty of Science, Khon Kaen University, Khon Kaen, 40002, Thailand;2. Institute of Nanomaterials Research and Innovation for Energy (IN–RIE), NANOTEC, KKU RNN on Nanomaterials Research and Innovation for Energy, Khon Kaen University, Khon Kaen, 40002, Thailand;3. National Metal and Materials Technology Center, National Science and Technology Development Agency, Thailand Science Park, Pathum Thani 12120, Thailand;4. Synchrotron Light Research Institute (Public Organization), 111 University Avenue, Muang District, Nakhon Ratchasima, 30000, Thailand;5. National Nanotechnology Center (NANOTEC), National Science and Technology Development Agency (NSTDA), Pathum Thani 12120, Thailand |
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| Abstract: | High dielectric permittivity (ε′ ≈ 2000―6900) was accomplished in Sn4+-doped CaCu2.95Mg0.05Ti4O12 ceramics while retaining a low loss tangent (tanδ ≈ 0.027―0.075). Further, significant improvements in the nonlinear electrical properties, such as high values of the breakdown electric field (Eb ≈ 1.2―1.3 × 104 V cm?1) and nonlinear coefficient (α ≈ 31), were achieved. In addition, the nonlinear electrical parameters significantly improved, which is consistent with the increase in the electrical resistivities of the grains and grain boundaries due to the decrease in the Cu+/Cu2+ ratio. According to our first-principles calculations, the Sn atom at the Ti site prefers to be close to the Mg atom at the Cu site, while the oxygen vacancy prefers to be located at large distances from the Sn and Mg co-dopants. This confirms that the dielectric behavior and the nonlinear electrical properties originate from the interface between the grain and grain boundary. |
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| Keywords: | Dielectric permittivity XANES First-principles calculations |
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