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薄膜X射线测厚仪
引用本文:靳其兵,江晶.薄膜X射线测厚仪[J].仪表技术与传感器,2007(5):18-19.
作者姓名:靳其兵  江晶
作者单位:北京化工大学自动化研究所,北京,100029
摘    要:介绍了以西门子PLC(可编程控制器)用于薄膜测厚的全自动往复式X射线测厚仪的研制,介绍了该测厚仪的硬件构成和测厚的工作原理。该装置已成功应用在双向拉伸聚丙烯薄膜生产线上。

关 键 词:测厚仪  X射线  薄膜
文章编号:1002-1841(2007)05-0018-02
修稿时间:2006-09-20

X-ray Thickness Gauge for Plastic Film
JIN Qi-bing,JIANG Jing.X-ray Thickness Gauge for Plastic Film[J].Instrument Technique and Sensor,2007(5):18-19.
Authors:JIN Qi-bing  JIANG Jing
Affiliation:Research Institute of Automation, Beijing University of Chemical Technology, Beijing 100029, China
Abstract:It described X-ray thickness gauge apparatus for plastic film including its working principle and hardware of its control system and the method of data processing.The equipment has been applied to BOPP product line successfully.
Keywords:thickness gauge  X-ray  plastic film
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