| X射线衍射外推法精确测定晶胞参数 |
| |
| 引用本文： | 储刚,黄继亮.X射线衍射外推法精确测定晶胞参数[J].计算机与应用化学,1995,12(1):72-75. |
| |
| 作者姓名： | 储刚 黄继亮 |
| |
| 作者单位： | 抚顺石油学院应用化学系 |
| |
| 摘 要： | 本文提出的晶胞参数精确测定方法是用测定晶体各个衍射谱线，利用新的外推函数消除系统误差，并根据最小二法求得最佳外推直线，得到精确的晶胞参数，实验分析表明，用这种方法可以得到精确的晶胞参数。
|
| 关 键 词： | X射线衍射 晶胞参数 精确测定 外推法 |
ACCURATE DETERMINATION OF LATTICE CONSTANT BY EXTENSION FUNCTION METHOD OF X-RAY DIFFRACTION |
| |
| Chu Gang, Huang Jiliang, Chen Gang.ACCURATE DETERMINATION OF LATTICE CONSTANT BY EXTENSION FUNCTION METHOD OF X-RAY DIFFRACTION[J].Computers and Applied Chemistry,1995,12(1):72-75. |
| |
| Authors: | Chu Gang Huang Jiliang Chen Gang |
| |
| Abstract: | The method of accurate determination of lattice constant is proposed in this paper to determine angle of every diffraction line of a crystal, and remove the system error using the new extension function. The best extension line can be obtained by the least square method. The analysis of the experiment demonstrated accurate lattice constants using this method. |
| |
| Keywords: | Lattice constant New extension function Accurat determination |
| 本文献已被 CNKI 维普 等数据库收录！ |
