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SRAM型FPGA互连资源单故障的一种检测方法
引用本文:徐健 黄维康. SRAM型FPGA互连资源单故障的一种检测方法[J]. 复旦学报(自然科学版), 1999, 38(3): 348-352
作者姓名:徐健 黄维康
作者单位:复旦大学电子工程系
摘    要:采用三次编程的方法对SRAM到FPGA中连线资源模型的单故障进行检测与定位,在给定的故障模型下,三次编程并施加文中所给测试向量集T后,可使单故障的故障覆盖率达100%,对线段(Segment)的stuckat故障,开路故障,桥接故障可定位到线段。

关 键 词:SRAM型FPGA 故障模型 故障检测 故障诊断 现场可编程门阵列器件 互连资源模型

A Test Method for Single Fault in Interconnects of SRAM Based FPGAs
Xu Jian,Huang Weikang. A Test Method for Single Fault in Interconnects of SRAM Based FPGAs[J]. Journal of Fudan University(Natural Science), 1999, 38(3): 348-352
Authors:Xu Jian  Huang Weikang
Affiliation:Department of Electronic Engineering
Abstract:A three step programming method to detect single fault in SRAM Based FPGA interconnection resources is proposed. A single fault model is given. Fault detection for the fault model are discussed. A 100% fault coverage can be achieved in the three steps by applying the proposed test sets. The accuracy of fault location is a single segment for a segment stuck at fault or a segment open fault, a segment pair for bridge fault.
Keywords:FPGA  fault model  fault detection  fault diagnosis  
本文献已被 CNKI 维普 等数据库收录!
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