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Determination of longitudinal and transverse shifts of three-dimensional Gaussian beams reflected at a grating near an anomaly
Authors:R GÜTHER  B H KLEEMANN  J ELSCHNER  G SCHMIDT
Affiliation:1. Ferdinand-Braun-Institut für H?chstfrequenztechnik, Albert-Einstein-Stra?e 11, D-12489 Berlin, Germany;2. e-mail: guether@fbh-berlin-de;3. Carl Zeiss, D-73446 Oberkochen, Germany;4. Weierstra?-Institut für Angewandte Analysis und Stochastik, Mohrenstra?e 39, D-10117 Berlin, Germany
Abstract:Spatial displacements of three-dimensional Gaussian beams diffracted at a reflection grating are studied theoretically and numerically. The complex diffraction coefficients (amplitudes and phases) of the grating diffracted plane waves calculated by a rigorous method for conical diffraction are the basis for this investigation. The classical analytical formula for the longitudinal shift depending on the gradient of the reflection phase is generalized to the simultaneous analytical treatment of the longitudinal Goos—Hänchen like shift as well as a transverse shift. A second method uses the full integration on the whole spectrum of plane waves of the diffracted beam.
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