New trim configurations for laser trimmed thick-film resistors—theoretical analysis, numerical simulation and experimental verification

In this paper a new approach to laser trimming is investigated and compared with traditional trimming. It relies on creating an additional contact for lowering resistance values thus simplifying the design and widening resistance trimming ranges. This enables to achieve a correction with shorter cut length of, so it can lead to a faster and cheaper fabrication process of hybrid integrated circuit. This paper analyses trimming range and trimming characteristics computed for different shapes of added contact using a new, very fast and easily programmable method. Moreover the experimental verification of such approach is presented. The relative trimming range and sensitivity are analyzed as a function of additional contact shape and cut length. Next long-term stability, pulse durability and low frequency noise are compared for two- and three-contact resistors versus trim pathway length.