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Neue Möglichkeiten der Oberflächenuntersuchung für die Lackforschung mittels der Raster-Elektronenmikroskopie
Authors:G. Pfefferkorn  R. Blaschke
Abstract:New Possibilities of Surface Investigation in Paint Research with electron-Microscopic Scanning A direct surface investigation of paint layers and material of the background is possible with the help of electron-microscopic scanning. With a simple procedure of sample preparation, it produces 20 to 50000 times enlarged pictures with plastic appearance having exceptionally good depth sharpness at a resolving power of 30 nm. The said procedure eliminates a few drawbacks of light microscopy, namely those related to depth sharpness and to sample preparation, as encountered in conventional transmission electron microscopy. Possibilities of extracting a few data for pigments in paint layers with the help of electron-microscopic scanning investigation are indicated.
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