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High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT’s |
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| Authors: | J Kuchenbecker M Borgarino M Zeuner U Knig R Plana F Fantini |
| Affiliation: | a LAAS-CNRS, 7 Avenue du Colonel Roche, 31077, Toulouse, France;b CNES, 18 Avenue Edouard Belin, 31401, Toulouse, France;c University of Modena and Reggio Emilia and INFM, 905 Via Vignolese, 41100, Modena, Italy;d DaimlerChrysler Research Center, Wilhelm-Runge-Str. 11, 89081, Ulm, Germany |
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| 本文献已被 ScienceDirect 等数据库收录！ | |
