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脉冲和锁相红外热成像检测技术的对比性研究
引用本文:霍雁,赵跃进,李艳红,张存林.脉冲和锁相红外热成像检测技术的对比性研究[J].激光与红外,2009,39(6):602-604.
作者姓名:霍雁  赵跃进  李艳红  张存林
作者单位:1. 北京理工大学信息科学学院,北京,100081
2. 首都师范大学物理系,北京,100048
基金项目:北京市教育委员会科技发展计划面上项目(No.KM200710028007);国家自然科学基金项目(No.10502035);973项目(No.2006CB605305)资助
摘    要:脉冲红外热成像使用脉冲热源,热源中具有广泛的频率分量,而锁相红外热成像技术使用周期热源,热源频率单一。两种热成像技术的热源工作方式和数据处理方式不同,两种技术各有优缺点。本文利用两种技术分别对电路板和平底洞试件进行了检测,通过实验结果来说明两种热成像技术的区别以及各自的优缺点。

关 键 词:脉冲红外热成像  锁相红外热成像  热源  位相

Comparison between pulse and lock-in infrared thermography technology
HUO Yan,ZHAO Yue-jin,LI Yan-hong,ZHANG Cun-lin.Comparison between pulse and lock-in infrared thermography technology[J].Laser & Infrared,2009,39(6):602-604.
Authors:HUO Yan  ZHAO Yue-jin  LI Yan-hong  ZHANG Cun-lin
Affiliation:The Information Science Academic of Beijing Institute of Technology,Beijing 100081,China;The Physics Department of Capital Normal University,Beijing 100048,China
Abstract:Pulsed infrared thermography uses the pulsed heat source which has a plurality of frequencies,but lock-in infrared thermography uses the periodic heat source which has only a single frequency.Since the work-style of heat source and data processing method are different between these two technologies,the article uses the two above mentioned technologies to inspect the PCB and Back-drilled flat bottom holes sample,according to the result of two technologies,differences between the two technologies and their advantages and disadvantages are presented.
Keywords:pulsed infrared thermography  lock-in infrared thermography  heat source  phase  
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