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The organization of a study of the field failure of electronic components
Authors:D. S. Campbell  J. A. Hayes  D. R. Hetherington
Abstract:This paper describes the organization that has been evolved for the collection and analysis of field failure data. A summary breakdown is given of the data collection organization, the Data Format and the methodology of Data Analysis. Preliminary studies show the system is working. The concept of superpopulation has been established in order to judge the relative importance of data as it is accumulated.
Keywords:Electronic Components  Reliability  Field failure
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