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基于交替变游程编码的测试数据压缩方法
引用本文:刘娟,詹文法,黄忠.基于交替变游程编码的测试数据压缩方法[J].安庆师范学院学报(自然科学版),2011,17(2):57-60.
作者姓名:刘娟  詹文法  黄忠
作者单位:安庆师范学院,物理与电气工程学院 安徽安庆,246133;安庆师范学院,教育学院,安徽安庆 246133
基金项目:安徽省高校优秀青年人才基金项目(No.2010SQRL110); 安徽省高校科学研究项目(No.KJ2010A230)资助; 安庆师范学院青年科研基金(No.KJ201007)资助
摘    要:提出了一种新的交替变游程编码的测试数据压缩方案。不像其它文章中仅仅编码连续的"0",该方案采用变长到变长的编码方式对0游程和1游程进行编码。实验数据表明,交替变游程编码能取得较高的压缩效率,能够显著减少测试时间和测试功耗,从而达到降低测试成本的目的。

关 键 词:测试数据压缩  变长-变长的编码  解压  系统芯片

Testing Data Compression Technique Based on Alternating Variable Run-Length Coding
LIU Juan,ZHAN Wen-fa,HUANG Zhong.Testing Data Compression Technique Based on Alternating Variable Run-Length Coding[J].Journal of Anqing Teachers College(Natural Science Edition),2011,17(2):57-60.
Authors:LIU Juan  ZHAN Wen-fa  HUANG Zhong
Affiliation:LIU Juan1,ZHAN Wen-fa2,HUANG Zhong1(1.School of Physics and Electrical Engineering,2.School of Education,Anqing Teachers College,Anqing 246133,China)
Abstract:A new test data compression technique based on alterating variable run-length coding is proposed.It is a variable-to-variable-length code based on encoding lengths of runs of 0s and 1s without limitation on runs of 0s as proposed.Experimental results show that this code can provide a high compression ratio and it also leads to a significant saving in test time,peak and average power,which results in reducing test cost.
Keywords:test data compression  variable-to-variable-length codes  decompression  system-on-a-chip  
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