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AlGaN/GaN double-channel HEMT
Authors:Quan Si  Hao Yue  Ma Xiaohu  Zheng Pengtian and Xie Yuanbin
Affiliation:Xidian University, Xi'an 710126, China;Xidian University, Xi'an 710126, China;Xidian University, Xi'an 710126, China;Xidian University, Xi'an 710126, China;Xidian University, Xi'an 710126, China
Abstract:The fabrication of AlGaN/GaN double-channel high electron mobility transistors on sapphire substrates is reported. Two carrier channels are formed in an AlGaN/GaN/AlGaN/GaN multilayer structure. The DC performance of the resulting double-channel HEMT shows a wider high transconductance region compared with single-channel HEMT. Simulations provide an explanation for the influence of the double-channel on the high transconductance region. The buffer trap is suggested to be related to the wide region of high transconductance. The RF characteristics are also studied.
Keywords:high-electron mobility transistor  AlGaN/GaN/AlGaN/GaN  double-channel
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