Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review

Failures induced on analog integrated circuits by electromagnetic interference (EMI) will be analyzed with particular emphasis on integrated operational amplifiers built with different technologies. Additionally, the correlation found between EMI susceptibility and large-signal opamp behavior will be discussed. Some criteria for the design of low EMI susceptibility opamps will be derived. Finally, as an application example, the design of a BiCMOS opamp with an extremely low-probability EMI-induced failure will be presented.