Microstructural and domain effects in epitaxial CoFe2O4 films on MgO with perpendicular magnetic anisotropy |
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Authors: | Ryan Comes Man GuMikhail Khokhlov Jiwei LuStuart A. Wolf |
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Affiliation: | a University of Virginia, Department of Materials Science and Engineering, 395 McCormick Rd., Charlottesville, VA 22904, United States b University of Virginia, Department of Physics, 382 McCormick Rd., Charlottesville, VA 22904, United States c Guilford College, 5800 West Friendly Ave., Greensboro, NC 27410, United States |
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Abstract: | CoFe2O4 (CFO) epitaxial thin films of various thicknesses were grown on MgO substrates using the pulsed electron-beam deposition technique. The films have excellent in-plane coherence with the substrate, exhibit layer-by-layer growth and have well-defined thickness fringes in x-ray diffraction measurements. Atomic force microscopy (AFM) measurements indicate that misfit dislocations form in thicker films and the critical thickness for the dislocation formation is estimated. Perpendicular magnetic anisotropy in CFO due to epitaxial in-plane tensile strain from the substrate was found. A stripe-like domain structure in the demagnetized state is demonstrated using magnetic force microscopy (MFM), in agreement with previous predictions. Coercivity increased in thicker films, which is explained by domain wall pinning due to misfit dislocations at the CFO/MgO interface. |
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Keywords: | Magnetic thin films Perpendicular magnetic anisotropy CoFe2O4 Pulsed electron deposition |
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