Investigation of the degradation of a thin-film hydrogenated amorphous silicon photovoltaic module |
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| Authors: | E.E. van Dyk A. Audouard E.L. Meyer C.D. Woolard |
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| Affiliation: | aDepartment of Physics, Nelson Mandela Metropolitan University, P.O. Box 77000, Port Elizabeth 6031, South Africa;bDepartment of Chemistry, Nelson Mandela Metropolitan University, P.O. Box 77000, Port Elizabeth 6031, South Africa |
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| Abstract: | The degradation of a thin-film hydrogenated single-junction amorphous silicon (a-Si:H) photovoltaic (PV) module has been studied. We investigated the different modes of electrical and physical degradation of a-Si:H PV modules by employing a degradation and failure assessment procedure used in conjunction with analytical techniques, including, scanning electron microscopy (SEM) and thermogravimetry. This paper reveals that due to their thickness, thin films are very sensitive to the type of degradation observed. Moreover, this paper deals with the problems associated with the module encapsulant, poly(ethylene-co-vinylacetate) (EVA). The main objective of this study was to establish the influence of outdoor environmental conditions on the performance of a thin-film PV module comprising a-Si:H single-junction cells. |
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| Keywords: | Photovoltaic modules a-Si:H EVA encapsulant Degradation Failure analysis |
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