首页 | 官方网站   微博 | 高级检索  
     

基于输入分解输出匹配的多态自检电路进化设计
引用本文:柏磊,严璐,王克让,朱晓华.基于输入分解输出匹配的多态自检电路进化设计[J].电子与信息学报,2012,34(6):1494-1500.
作者姓名:柏磊  严璐  王克让  朱晓华
作者单位:1. 南京理工大学电子工程与光电技术学院 南京210094
2. 南京莱斯信息技术股份有限公司 南京210007
基金项目:国家自然科学基金,航空基金,中国博士后基金,南京理工大学自主科研专项计划(2010ZYTS028)资助课题
摘    要:针对进化方法在多态自检电路设计方面存在的扩展性问题,该文提出了一种基于输入分解输出匹配的多态自检电路进化设计方法。该方法将原始电路分解为可进化生成部分和固定部分,由此减少待进化设计电路的输入个数以及适应度评价时真值表输入输出组合数量,从而降低电路进化复杂度;在适应度评价阶段,当电路输出位与理想输出匹配度小于1/2时,通过添加非门的形式提高候选电路适应度和种群多样性,防止最优结构的丢失。进化设计实验将多态门和普通门相结合,进行了两种多态自检加法器的设计。结果表明,与传统多态自检电路进化设计方法相比所提方法进化代数分别减少了47.9%和89.1%,单个测试参量下故障覆盖率分别提高了75.7%和79.7%,具有收敛速度快、扩展性好、故障覆盖率高的优点。

关 键 词:大规模集成电路    多态电路    自检电路    进化设计    扩展性
收稿时间:2011-09-16

Evolutionary Design of Polymorphic Self-checking Circuits Based on Inputs Decomposition and Outputs Matching
Bai Lei , Yan Lu , Wang Ke-rang , Zhu Xiao-hua.Evolutionary Design of Polymorphic Self-checking Circuits Based on Inputs Decomposition and Outputs Matching[J].Journal of Electronics & Information Technology,2012,34(6):1494-1500.
Authors:Bai Lei  Yan Lu  Wang Ke-rang  Zhu Xiao-hua
Affiliation:Bai Lei① Yan Lu② Wang Ke-rang① Zhu Xiao-hua① ①(School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology,Nanjing 210094,China) ②(Nanjing LES Information Technology Company Limited,Nanjing 210007,China)
Abstract:To solve the problem of scalability in designing polymorphic self-checking circuits using evolutionary design,a new method based on inputs decomposition and outputs matching is proposed.The system is decomposed into evolvable part and fixed part,and the number of input-output combinations can be decreased by decomposing the inputs of the system,thus the complexity of evolution is reduced.The NOT gate is added to outputs of the candidate circuits when the matching degree of the outputs is lower than 1/2 compared with desired outputs in the stage of fitness evaluation.The fitness as well as the diversity of the population is increased,and the optimum structure is protected from being eliminated.The evolutionary design experiments for two kind of self-checking adders are conducted by combining the polymorphic gates with ordinary gates.The results show that the generation of evolution is decreased by 47.9% and 89.1% while the fault coverage of single test vector is decreased by 75.7% and 79.7% compared with conventional method in designing polymorphic self-checking circuits.The proposed method enjoys advantages of faster convergence,better scalability and higher fault coverage.
Keywords:VLSI  Polymorphic circuits  Self-checking circuits  Evolutionary design  Scalability
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《电子与信息学报》浏览原始摘要信息
点击此处可从《电子与信息学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号