| 基于嵌入式技术的电子标签质量检测系统 |
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| 引用本文： | 孙正捷,杨成忠,薛凌云.基于嵌入式技术的电子标签质量检测系统[J].杭州电子科技大学学报,2007,27(1):73-76. |
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| 作者姓名： | 孙正捷 杨成忠 薛凌云 |
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| 作者单位： | 杭州电子科技大学自动化学院,浙江,杭州,310018 |
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| 摘 要： | 该文介绍了一款电子标签质量检测系统的设计和实现,系统应用于电子标签产品生产的质量检测环节.系统基于ARM嵌入式硬件平台,根据互感耦合原理,应用DDS频率合成技术、FIFO数据缓冲结构及数字信号处理技术实现了电子标签质量参数的精确测量.通过实验测试及现场运行证明,该系统检测精度高,运行稳定可靠.
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| 关 键 词： | 电子标签 嵌入式技术 互感耦合 嵌入式技术 电子标签 质量参数 检测系统 Technology Embedded Based Label Electronic Testing System 运行稳定 检测精度 实验测试 精确测量 处理技术 数字信号 缓冲结构 数据 FIFO 合成技术 |
| 文章编号： | 1001-9146（2007）01-0073-04 |
| 收稿时间： | 2006-10-31 |
| 修稿时间： | 2006-10-31 |
Quality Testing System for Electronic Label Based on Embedded Technology |
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| SUN Zheng-jie,YANG Cheng-zhong,XUE Ling-yun.Quality Testing System for Electronic Label Based on Embedded Technology[J].Journal of Hangzhou Dianzi University,2007,27(1):73-76. |
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| Authors: | SUN Zheng-jie YANG Cheng-zhong XUE Ling-yun |
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| Affiliation: | Schol of Automtion, Hangzhou Dianzi University, Hangzhou Zhejiang 310018, China |
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| Abstract: | This paper introduced a quality testing system for electronic label. This system, which is based on ARM system, is used to test the quality of label products. Based on the principle of mutual inductance coupling, this system adopts to the techniques such as DDS and realized the accurate testing of the quality parameters of electronic labels. This system is accurate and reliable empirically. |
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| Keywords: | electronic labels embedded technology mutual inductance coupling |
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