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La0.8Ca0.2MnO3/SrTiO3薄膜厚度对其结构及磁学性能的影响
引用本文:张红娣,安玉凯,麦振洪,高炬,胡凤霞,王勇,贾全杰.La0.8Ca0.2MnO3/SrTiO3薄膜厚度对其结构及磁学性能的影响[J].物理学报,2007,56(9):5347-5352.
作者姓名:张红娣  安玉凯  麦振洪  高炬  胡凤霞  王勇  贾全杰
作者单位:(1)香港大学物理系,香港; (2)中国科学院高能物理研究所,北京 100049; (3)中国科学院物理研究所国家凝聚态物理实验室,北京 100080
摘    要:采用多种X射线衍射技术和磁电阻测量技术研究了不同厚度的La0.8Ca0.2MnO3/SrTiO3 (LCMO/STO)薄膜的应变状态及其对磁电阻性能的影响.结果表明,在STO(001)单晶衬底上生长的LCMO薄膜沿[00l]取向生长.LCMO薄膜具有伪立方钙钛矿结构,随着薄膜厚度的增加,面内晶格参数增加,垂直于面内的晶格参数减小,晶格参数ab相近,略小于c.LC 关键词: X射线衍射 微结构 应变 物理性能

关 键 词:X射线衍射  微结构  应变  物理性能
文章编号:1000-3290/2007/56(09)/5347-06
收稿时间:2006-09-18
修稿时间:2006-09-18

Thickness effect on structure and magnetic properties of La0.8Ca0.2MnO3/SrTiO3 films
Zhang Hong-Di,An Yu-Kai,Mai Zhen-Hong,Gao Ju,Hu Feng-Xia,Wang Yong,Jia Quan-Jie.Thickness effect on structure and magnetic properties of La0.8Ca0.2MnO3/SrTiO3 films[J].Acta Physica Sinica,2007,56(9):5347-5352.
Authors:Zhang Hong-Di  An Yu-Kai  Mai Zhen-Hong  Gao Ju  Hu Feng-Xia  Wang Yong  Jia Quan-Jie
Affiliation:1 Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China; 2 Department of Physics, University of Hong Kong , Hong Kong , China; 3Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
Abstract:The thickness dependence of strain and magnetic properties of La0.8Ca0.2MnO3 (LCMO) thin films grown on SrTiO3 (STO) substrates were investigated by X-ray diffraction techniques and magnetic measurements. The results show that all the LCMO films are well oriented in the (00l) direction on the (001) STO substrate. The LCMO thin films have a pseudo-cubic structure. With the film thickness increasing, the in-plane lattice parameters decrease while the out-of-plane lattice parameter increases. The lattice parameter a is close to b, but a little smaller than c. The in-plane strain in the film is tensile due to the lattice mismatch between the LCMO film and STO substrate, whereas that out-of-plane is compressive. The LCMO films have a slightly perceptible mosaic structure along the qz direction, and there exists an angular deviation of about 0.1° between [001]LCMO and [001]STO. The physical properties of the films strongly depend on the film thickness. With the increase of the film thickness the TMI is enhanced, and the MR is weakened.
Keywords:X-ray diffraction  microstructures  strain  physical properties
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