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Development of Heterojunction Diode-Type Gamma Ray Detectors Based on Epitaxially Grown Thick CdTe on$hboxn^+$-Si Substrates
Authors:Yasuda   K. Niraula   M. Noda   K. Yokota   M. Ohashi   H. Nakamura   K. Omura   M. Shingu   I. Minoura   S. Tanaka   R. Agata   Y.
Affiliation:Graduate Sch. of Eng., Nagoya Inst. of Technol.;
Abstract:Room temperature nuclear radiation detectors with energy discrimination capability developed by growing thick cadmium telluride (CdTe) epitaxial layers directly on n+-Si substrates in a metal-organic vapor phase epitaxy system is reported for the first time. The CdTe/n+-Si heterojunction diode detector exhibited good rectification and charge collection properties. The reverse leakage currents were typically 1times10-7 to 5times10-7 A/cm2 at 50-V bias. The detector clearly demonstrated its energy discrimination capability by resolving gamma peak from the 241Am radioisotope during radiation detection test at room temperature
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