首页 | 官方网站   微博 | 高级检索  
     


Molecular beam epitaxial growth and thermodynamic analysis of InGaAs and InAlAs lattice matched to InP
Authors:M McElhinney and C R Stanley
Affiliation:

a MBE Research Group, Department of Electronics and Electrical Engineering, University of Glasgow Glasgow G12 8QQ United Kingdom

Abstract:Reflection high-energy electron diffraction (RHEED) intensity oscillations have been used to detect the onset of metal droplet formation on the surface of InAs, InGaAs and InAlAs during molecular beam epitaxy. The growth conditions which produce such droplets are shown to be in good agreement with predictions based on thermodynamic arguments.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号