Degradation‐shock‐based Reliability Models for Fault‐tolerant Systems |
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Authors: | Zhenyu Liu Xiaobing Ma Lijuan Shen Yu Zhao |
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Affiliation: | 1. Beijing Institute of Space Long March Vehicle, Beijing, China;2. School of Reliability and Systems Engineering, Beihang University, Beijing, China;3. China Electric Power Research Institute, Beijing, China |
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Abstract: | Reliability modeling of fault‐tolerant systems subject to shocks and natural degradation is important yet difficult for engineers, because the two external stressors are often positively correlated. Motivated by the fact that most radiation‐induced failures are contributed from these two external stressors, a degradation‐shock‐based approach is proposed to model the failure process. The proposed model accommodates two kinds of failure modes: hard failure caused by shocks and soft failure caused by degradation. We consider a generalized m–δ shock model for systems with fault‐tolerant design: failure occurs if the time lag between m sequential shocks is less than δ hours or degradation crosses a critical threshold. An example concerning memory chips used in space is presented to demonstrate the applicability of the proposed model. Copyright © 2015 John Wiley & Sons, Ltd. |
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Keywords: | degradation shock model fault tolerant total ionizing dose single‐event upset |
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