| SPARC体系结构处理器测试方法研究与实现 |
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| 引用本文： | 张晓静,华更新,刘鸿瑾. SPARC体系结构处理器测试方法研究与实现[J]. 计算机测量与控制, 2011, 19(3) |
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| 作者姓名： | 张晓静 华更新 刘鸿瑾 |
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| 作者单位： | 北京控制工程研究所,北京,100190 |
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| 摘 要： | 处理器离线测试广泛采用随机测试技术,但是随机测试技术生成大量测试代码,并且测试覆盖率不高;主要针对随机测试的不足,借鉴基于软件内建自测试方法建立处理器模块级于系统级功能模型,后分析功能模型可能发生错误,针对错误模型开发测试代码来提高错误覆盖率;经测试,模块级测试覆盖到所有功能点,达到功能模块100%测试,系统级的测试覆盖到SPARC V8的所有指令异常、正常测试用例;测试结果表明,所采取的测试方案对提高错误覆盖率是行之有效的.
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| 关 键 词： | 微处理器测试 指令集测试 伪随机测试 |
Study and Implementation of Test Method for SPARC Processor |
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| Zhang Xiaojing,Hua Gengxin,Liu Hongjin. Study and Implementation of Test Method for SPARC Processor[J]. Computer Measurement & Control, 2011, 19(3) |
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| Authors: | Zhang Xiaojing Hua Gengxin Liu Hongjin |
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| Affiliation: | Zhang Xiaojing,Hua Gengxin,Liu Hongjin(Beijing Institute of Control Engineering,Beijing 100190,China) |
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| Abstract: | Random test technology is widely used in processor off-line test,but Random test generate large amount of test code,and low fault coverage.The paper aim at shortage of random test,using software-based self-testing construct module level and system-level fault models of functional level,then analyse fault of functional models,and develop test code to improve fault coverage.By test,module testing coverage 100% module function,system-level testing coverage all the SPARC V8 instructions set and its exception,th... |
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| Keywords: | microprocessors test instruction test random test. |
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