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Effect of Cr on the magnetic properties of evaporated CoxCr1−x/Si(1 0 0) and CoxCr1−x/glass thin films |
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| Authors: | A Kharmouche S-M Chérif G Schmerber |
| Affiliation: | a Faculté des Sciences de l’Ingénieur, Université Ferhat Abbas, Rue de Scipion, Sétif 19000, Algeria b Laboratoire PMTM, Institut Galilée, Université Paris 13, Villetaneuse, 93340, France c IPCMS-GEMME, UMR-CNRS, Université Louis Pasteur, 23 rue du Loess, B.P.43, 67034, Strasbourg, Cedex 2, France |
| Abstract: | Series of CoxCr1−x thin films have been evaporated under vacuum onto Si(1 0 0) and glass substrates. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Alternating gradient field magnetometer (AGFM) measurements provided saturation magnetization values ranging from 220 to 1200 emu/cm3. Values of squareness exceeding 0.8 have been measured. Coercive field may reach values up to 700 Oe, depending on the percentage of chromium, as well as the substrate nature and the direction of the applied magnetic field. The saturation magnetization value decreases as the Cr content increases. In order to study their dynamical magnetic properties, Brillouin Light Scattering (BLS) measurements have been performed on these samples. Stiffness constant value and anisotropy magnetic field were adjusted to fit the experimental BLS spectra. These results are analyzed and correlated. |
| Keywords: | 81 30 Dz 75 70 &minus i 75 60 &minus d 75 30 Gw 78 35 +c |
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