Microwave dielectric properties,low-temperature sintering mechanism,and defects behaviour of temperature stable (1-x)Li2Zn3Ti4O12-xSr3(VO4)2 ceramics

(1-x)Li₂Zn₃Ti₄O₁₂-xSr₃(VO₄)₂ (0.1 ≤ x ≤ 0.4) microwave dielectric ceramics were fabricated by solid-state sintering technology. The impact of SV addition on the microstructure, dielectric properties, sintering process, and defects behaviour was studied. The formation of SrTiO₃ and the glass phase were observed via XRD and TEM, and the latter resulted in a decrease in the sintering temperature. The variations in microwave dielectric properties were consistent with the empirical mixture rules calculated by XRD refinement, and a near-zero τ_f value was obtained. The Li, Zn and V elements of the glass phase and the liquid phase sintering model were deduced via DSC, TEM and Raman spectroscopy. Then, the defect behaviour, such as oxygen vacancies, Ti³⁺, and V⁴⁺, was investigated by XPS and complex impedance spectroscopy. It was found that the generation and migration of defects occurred much more easily in 0.7LZT-0.3 SV than in LZT, resulting in a higher dielectric loss. Finally, the 0.7Li₂Zn₃Ti₄O₁₂-0.3Sr₃(VO₄)₂ ceramic sintered at 900 °C exhibited excellent microwave dielectric properties of ε_r = 17.8, Q × f = 41,891 GHz, and τ_f = ?4.4 ppm/°C and good compatibility with silver electrode, showing a good potential application for LTCC.