High-speed, low-noise InGaP/GaAs heterojunction bipolar transistors |
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Authors: | Fresina MT Ahmari DA Mares PJ Hartmann QJ Feng M Stillman GE |
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Affiliation: | Microelectron. Lab., Illinois Univ., Urbana, IL ; |
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Abstract: | We have demonstrated self-aligned InGaP/GaAs heterojunction bipolar transistors (HBT's) with excellent dc, microwave, and noise performance. A 3×10 μm2 emitter finger device achieved a cutoff frequency of fT=66 GHz and a maximum frequency of oscillation of fmax=109 GHz. A minimum noise figure of 1.12 dB and an associated gain of 11 dB were measured at 4 GHz. These results are the highest combined fT+fmax and the lowest noise figure reported for an InGaP/GaAs HBT and are attributed to material quality and the use of self-aligned base contacts. These data clearly demonstrate the viability of InGaP/GaAs HBT's for high-speed, low-noise circuit applications |
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