非线性模拟电路可测试性度量研究

模拟电路的可测试性度量是指导其进行可测试性设计的基础,针对目前非线性模拟电路可测试性分析过程复杂,无法量化的问题,在深入研究模拟电路可测试性度量和非线性模拟电路特性的基础上,利用分段线性方法将非线性模拟电路近似等效为线性模拟电路,并给出了非线性模拟电路可测试性度量的计算方法,极大拓宽了可测试性度量的应用范围;最后通过实例详细讲解了计算过程,并利用模拟电路可测试性度量的定义验证了该结果的有效性,该方法计算量小,不受容差影响,对非线性模拟电路可测试性研究具有一定的指导意义。

Researches of Testability Measurement of Nonlinear Analog Circuit

Testability measurement of analog circuit is the base of design for testability,for overcoming the problem that testability analysis is perplexed,and can’t be quantified,based on the study of testability measure of analog circuit and the characteristic of nonlinear analog circuit,using the piecewise linear method to analyze nonlinear analog circuit,the method of nonlinear analog circuit testability measure is presented,introduce the process of calculation through a example,and use the definition of the testability measurement verify the validity of the results.This method expands greatly the application range of testability measure,and has a positive significance for the testability design of nonlinear analog circuit.