| 模拟电路边界扫描功能性测试模型研究 |
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| 引用本文： | 冯长江,李晓峰.模拟电路边界扫描功能性测试模型研究[J].计算机测量与控制,2011,19(10). |
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| 作者姓名： | 冯长江 李晓峰 |
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| 作者单位： | 军械工程学院,河北石家庄,050003 |
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| 摘 要： | 边界扫描技术在数字电路中已经基本成熟,但在模拟电路中还涉足较少。为了提高模拟电路系统的可靠性和可测性设计,对模拟电路面向功能性测试的边界扫描模型进行了研究,结合IEEE1149.1标准框架结构和IEEE1149.4标准混合信号测试总线思想,提出了利用数字寄存器控制模拟开关的边界扫描单元结构,设计了面向功能测试的模拟电路边界扫描模型,简化了测试存取口,降低了测试难度,同时构建了模型测试平台,实现了模型的功能测试功能。
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| 关 键 词： | 模拟电路 边界扫描 ATAP控制器 功能测试 |
Research on Functional Boundary Scan Test Model for Analog Circuit |
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| Feng Changjiang,Li Xiaofeng.Research on Functional Boundary Scan Test Model for Analog Circuit[J].Computer Measurement & Control,2011,19(10). |
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| Authors: | Feng Changjiang Li Xiaofeng |
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| Affiliation: | Feng Changjiang,Li Xiaofeng (Ordnance Engineering College,Shijiazhuang 050003,China) |
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| Abstract: | The application of boundary scan technology in digital circuit testing has already become mature,but it merely appeared in analog circuit.To improve the dependability and measurability of the analog circuit system,boundary scan test model for functional test of analog circuit was researched.Based on the structure from IEEE1149.1 and the idea of mixed signal test bus from IEEE1149.4,a boundary scan module structure which uses digital circuit to provide the enable signal for analog switches was put forward.A ... |
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| Keywords: | analog circuit boundary scan ATAP controller functionality test |
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