带有非边界扫描器件的混装电路的扫描链优化配置

在混装电路中,由不同的非边界扫描器件所组成的簇所需要的测试向量的数目可能是不同的,根据不同的簇所需要的测试向量的不同,可以将整个测试过程分为不同的测试阶段,每个测试阶段过后都会有一个或者多个扫描芯片处于bypass状态,而此时其长度只有1,也就是说每一个扫描链的长度是随着测试矢量的移出而变化的,整个扫描链的配置过程中,需要考虑这样两个问题：如何将扫描芯片分配给各条扫描链以及如何排列各条扫描链中扫描芯片的顺序,提出了一种如何配置单链的方法,即优化配置扫描芯片在扫描链中的顺序,这种方法同样可以被应用到多链.

Optional Configuration of Boundary Scan Chains for Mixed Circuit with Non- Boundary- Scan Devices

In mixed circuit,clusters testing which is composed of different Non-Boundary-Scan devices needs different numbers of test vectors.As different clusters need different test vectors,the whole test procedure is divided into different test section.And after every test section,there is one or more chips in bypass mode,and then it's length is only one.That is to say,the length of every scan chains is changing with shifting out the test vectors.So we should consider two problems in the process of configuration of boundary scan chains: how to distribute the boundary scan chips to every boundary scan chains and how to arrange the boundary scan chips in every chains.On above theory,a method is presented to configurate single chain,optimizing the configuration of the order of every boundary scan chip in scan chains.Also this method could be used to configure multiple scan chains.