| 液晶显示器Mura缺陷及测量方法浅析 |
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| 引用本文： | 张鹏,马婷婷,杨叶花,王潇潇,黄锋,谭山.液晶显示器Mura缺陷及测量方法浅析[J].电子测试,2017(6). |
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| 作者姓名： | 张鹏 马婷婷 杨叶花 王潇潇 黄锋 谭山 |
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| 作者单位： | 广州计量检测技术研究院 国家光电成像及显示产品质量监督检验中心,广东 广州,510030 |
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| 基金项目： | 国家质检总局科技计划项目，广东省科技计划项目 |
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| 摘 要： | Mura缺陷是液晶显示器(LCD)中常见的不良现象,直接影响到显示图像质量.本文对液晶显示器Mura缺陷进行了详细的综述,首先概述了Mura缺陷的种类及主要来源,然后介绍了Mura缺陷的三类测量方法:人工视觉识别法、电学测量法、光学测量法.人工视觉识别法利用滤光片观察样品,成本较低,但无法做到客观的评定产品等级;电学测量法适用于电气缺陷造成的Mura;基于机器视觉的光学测量法是当前研究的热点,对于各种原因造成的Mura缺陷均具有良好的检测效果.详细分析了各种检测方法的特点,最后进行归纳总结.
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| 关 键 词： | LCD Mura缺陷 人工视觉识别法 机器视觉 |
Mura defect and Measurement Method of Liquid Crystal Display |
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| Zhang Peng,Ma Tingting,Yang Yehua,Wang Xiaoxiao,Huang Feng,Tan San.Mura defect and Measurement Method of Liquid Crystal Display[J].Electronic Test,2017(6). |
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| Authors: | Zhang Peng Ma Tingting Yang Yehua Wang Xiaoxiao Huang Feng Tan San |
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| Abstract: | Mura defect is a common phenomenon in liquid crystal display (LCD), which directly affects the quality of the display image. In this paper, Mura defect of liquid crystal display (LCD) is reviewed in detail. First, the types and main sources of Mura defects are summarized, and then three kinds of measurement methods of Mura defects are introduced, which are artificial visual recognition, electrical measurement and optical measurement. Artificial visual recognition method using filter observation samples, low cost, but can't achieve the objective evaluation of product grades; electrical measurement method is used in the Mura caused by electrical defects; optical measurement method based on machine vision is a hotspot of current research, Mura defects for various reasons have good detection effect. The characteristics of various measurement methods are analyzed in detail, and the conclusion is summarized. |
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| Keywords: | LCD Mura defect artificial visual recognition method machine vision |
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