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基于非分光红外技术的低浓度SF6气体检测方法
引用本文:袁子茹,汪献忠,吕运朋,薛冰. 基于非分光红外技术的低浓度SF6气体检测方法[J]. 仪表技术与传感器, 2012, 0(1): 80-81,84
作者姓名:袁子茹  汪献忠  吕运朋  薛冰
作者单位:1. 郑州大学,河南郑州,450001
2. 河南日立信股份有限公司,河南郑州,450001
摘    要:文中介绍了一种基于非分光红外技术(NDIR)的高灵敏度的SF6气体浓度检测仪,测量范围可达0~50 ppm(1ppm=10-6),精度为0.1 ppm,由于传感器的特殊结构设计,使得其可以定点检测出SF6断路器或者GIS高压开关设备的微量泄露,对于设备的密封性检测有着实际的意义。

关 键 词:非分光红外  SF6  便携式  微量泄漏

Low Concentration of SF6 Gas Detection Method Based on NDIR Technology
YUAN Zi-ru , WANG Xian-zhong , Lü Yun-peng , XUE Bing. Low Concentration of SF6 Gas Detection Method Based on NDIR Technology[J]. Instrument Technique and Sensor, 2012, 0(1): 80-81,84
Authors:YUAN Zi-ru    WANG Xian-zhong    Lü Yun-peng    XUE Bing
Affiliation:1.Physical Engineering College,Zhengzhou University,Zhengzhou 450001,China; 2.Corporation of Relations,Zhengzhou 450001,China)
Abstract:This paper presented a SF6 gas concentration detector with the high sensitivity based on non-spectral infrared(NDIR) technique.Its measuring range is up to 0 to 50 ppm,and the accuracy is 0.1 ppm.Due to the special structure of the sensor design,it can detect SF6 GIS high-voltage switchgear circuit breaker or trace leak tightness testing,the device has a practical significance.
Keywords:NDIR  SF6  portable  trace leaks
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