通信芯片电压故障注入测试与功能安全评估方法

芯片是现代信息技术的核心和基础，芯片的功能安全在确保电子技术的可靠性方面发挥着重要作用。本研究以CAN通信芯片为对象，提出了一种基于电压故障注入的芯片功能安全评估方法。通过基于原型系统的自动化硬件故障注入测试，并结合自动触发信号与控制模块的设计，完善了目前CAN芯片安全性测试技术和功能实现上的不足。另外，基于该CAN芯片测试结果，提出了芯片对故障因素敏感的功能安全评估依据。结果表明，该电路通信芯片的某些管脚对标准工作电压范围下输入电压的幅值、脉宽和延迟毛刺较敏感。测试电路系统能够自动实现1.5~5.5 V大范围工作电压下的随机错误注入，以及错误要素敏感度分析，为提高通信芯片安全性提供更高效的评估依据。

Voltage Fault Injection Measurement and Functional Safety Assessment for Communication Chips

Chips provide a core and fundamental guarantee for building modern information technology.The Functional Safety of chips plays an important role in ensuring the reliability of electronic technology.This work is aimed at a CAN communication chip and presents an assessment method of chip functional safety based on voltage fault injection(FI)measurement results.The hardware voltage FI measurements of CAN chip have been completed using the prototype system. The signal trigger and control module are designed for improving the current FI technology and experiment implementation.In addition, the Functional Safety assessment of CAN chip is carried out based on the results. It shows that some pins of these chips are sensitive to the input voltage amplitude, pulse width, and delay in the standard operating voltage range. The system can automatically realize the voltage random fault generation in the range of 1.5~5.5 V and error elements sensitivity results analysis, which provides more accurate and efficient assessment basis for improving the security of communication chip.