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高分辨率X射线显微成像及其进展
引用本文:陈洁,柳龙华,刘刚,田扬超.高分辨率X射线显微成像及其进展[J].物理,2007,36(8):588-594.
作者姓名:陈洁  柳龙华  刘刚  田扬超
作者单位:中国科学技术大学国家同步辐射实验室,合肥,230029
摘    要:介绍了高分辨率X射线显微成像产生背景和发展过程,着重分析了基于光学元件波带片的放大成像的基本原理,并简述了高分辨率三维成像的有关理论。同时给出国内外高分辨率X射线显微成像研究的最新进展,展望了高分辨率X射线显微成像的应用前景。

关 键 词:X射线显微成像  高分辨率  波带片
修稿时间:2006-12-042007-05-09

High resolution X-ray microscopy and its new developments
CHEN Jie,LIU Long-Hua,LIU Gang,TIAN Yang-Chao.High resolution X-ray microscopy and its new developments[J].Physics,2007,36(8):588-594.
Authors:CHEN Jie  LIU Long-Hua  LIU Gang  TIAN Yang-Chao
Affiliation:National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
Abstract:The background and principle of zone plate based high resolution X-ray microscopy is reviewed, as well as X-ray 3D imaging. The latest developments and future prospects in this field are also discussed.
Keywords:X-ray microscopy  high resolution  zone plate
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