Z箍缩等离子体均匀色散晶体光谱成像

为了诊断Z箍缩等离子体X射线相关信息，利用自聚焦和均匀色散原理，研制了一种新型的均匀色散弯晶谱仪。晶体分析器采用-石英（1010），布拉格角为43.4~72.7，利用有效面积为10 mm50 mm的X射线胶片接收光谱信号,实验在中国工程物理研究院阳加速器装置上进行，摄谱元件获得了Z箍缩铝丝阵等离子体的类H及类He谱线。实验结果表明:谱线分布遵循均匀色散条件，所研制均匀色散弯晶谱仪线色散率为-116.198 mm/nm，与理论值-120 mm/nm的相对误差为3.168%，能够用于Z箍缩等离子体X射线的光谱学研究。

Z-pinch plasma spectral imaging with uniform dispersion crystal

Based on the self-focusing and uniform dispersion principle, a spectrograph with uniform dispersion bent crystal was developed for Z-pinch plasma X-ray diagnosis. α-quartz (1010) crystal was used as dispersion element and the Bragg angle of the crystal analyzer ranged from 43.4° to 72.7°. The X-ray film was employed to receive the spectra with an effective area of 10 mm×50 mm. The experiment was carried out at the Yang accelerator in China Academy of Engineering Physics. The H-like and He-like spectra of aluminum Z-pinch plasma were obtained. The distribution of aluminum spectra satisfies the uniform dispersion condition. The linear dispersion of the developed spectrograph is -116.198 mm/nm and the error is only 3.168% relative to the theoretical value of -120 mm/nm. The experimental results demonstrate that the uniform dispersion bent crystal spectrograph is suitable for Z-pinch plasma X-ray spectroscopy diagnosis.