合肥X射线衍射光束线单色仪中晶体反射曲线的测量

合肥X射线衍射光束线装备了一台以两晶体无色散 ( +n ,-n)排列 ,能量可连续扫描 ,空间位置固定输出为特点的双晶单色仪。选用单晶硅作为分光元件 ,它所对应的不同能量产生的全反射的本征宽度决定了双晶单色仪的分辨率。因此 ,晶体在投入使用之前 ,测量它的本征宽度 ,为单色仪的调试提供依据是非常必要的。介绍了用于合肥X射线衍射光束线单色仪中两块晶体的测量 ,包括测试方法、装置、测量结果和分析。

Measurement of the reflection curve of crystals used in the monochromator of X-ray diffraction Beamline at NSRL

An X-ray diffraction beamline at NSRL is equipped with a double-crystal Monochromator, which is characterized by non-dispersive (+n,-n)arrangement of two crystals, energy scanning and a spatially fixed exit beam. The monolith silicon crystals are chosen as the diffraction elements of the monochromator, whose intrinsic width of the Bragg reflection determines the energy resolution and the photon output transmitted by the monochromator. So it's necessary to measure the intrinsic width and the error in the normal direction of the crystals to provide basis for the monochromator alignment. The measurement of the intrinsic width of the crystals used for the X-ray diffraction beamline, including measuring method, equipment used, result and analysis are presented in the paper.