Simple material parameter estimation via terahertz time-domain spectroscopy |
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| Authors: | Withayachumnankul W Ferguson B Rainsford T Mickan SP Abbott D |
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| Affiliation: | Dept. of Electr. & Electron. Eng., Univ. of Adelaide, SA, Australia; |
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| Abstract: | A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 /spl mu/m at a frequency of 0.1 THz or 20 /spl mu/m at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon. |
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