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多注速调管外加载谐振腔的分析和模拟
引用本文:张丁. 多注速调管外加载谐振腔的分析和模拟[J]. 电子与信息学报, 2007, 29(5): 1263-1266. doi: 10.3724/SP.J.1146.2006.01300
作者姓名:张丁
作者单位:中科院研究生院,北京,100039;中国科学院电子学研究所,北京,100080
摘    要:该文对多注速调管谐振腔内加载技术和外加载技术以及相关的微波吸收材料作了分析和比较;理论上阐明外加载谐振腔品质因数的调节途径,用MWS设计出符合要求的外加载谐振腔;对由此产生的模式不对称性进行校正,找出了外加载谐振腔品质因数的影响因素和规律。

关 键 词:速调管  谐振腔  品质因数  频率  微波衰减材料
文章编号:1009-5896(2007)05-1263-04
收稿时间:2006-09-05
修稿时间:2006-12-22

Analysis and Simulation of the Out-loaded Resonant Cavity Using in the Multi-beam Klystron
Zhang Ding. Analysis and Simulation of the Out-loaded Resonant Cavity Using in the Multi-beam Klystron[J]. Journal of Electronics & Information Technology, 2007, 29(5): 1263-1266. doi: 10.3724/SP.J.1146.2006.01300
Authors:Zhang Ding
Affiliation:Institute of Electronics, Chinese Academy of Sciences, Beijing 100080, China; Graduate University of Chinese Academy of Science, Beijing 100039, China
Abstract:First of all, the in-loaded and out-loaded technologies of resonant cavity being used in the multi-beam klystron and some associated microwave attenuating materials are analyzed and compared. Not only the ways of adjustment of out-loaded resonant cavity quality characteristic is illuminated in theory, but is designed the out-loaded resonant cavity meeting the demand. Finally, the asymmetry of the E-field of the mode caused by the out-loaded cavity is adjusted and the influent factors and the change laws of quality characteristic of the out-loaded resonant cavity are located.
Keywords:Klystron   Resonant cavity   Quality characteristic   Frequency   Microwave attenuating materials
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