An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation |
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Authors: | Haijun Sun Yongjia Zeng Pu Li Shaochong Lei Zhibiao Shao |
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Affiliation: | 1. School of Information Engineering, Zhengzhou University, Zhengzhou, 450001, China 2. Department of Microelectronics, Xi??an Jiao Tong University, Xi??an, 710049, China
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Abstract: | This paper presents a novel seed-based test pattern generator (SB-TPG). The core of SB-TPG is a seed sequence generator. A coverage-driven seed generation algorithm has been proposed to generate the optimized seeds. The test sequence generated by SB-TPG is a single input change (SIC) sequence that can significantly reduce test power for test-per-clock built-in self-test (BIST). Further, seed-masking technique has been put forward to filter those power-consuming seeds, thus reducing test power for test-per-scan BIST. Experimental results show that SB-TPG can achieve high fault coverage with short test length, low power and small hardware overhead. |
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