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A Method for Calculating Thermal Radiation Properties of Multilayer Films from Optical Constants
Authors:R Horikoshi  Y Nagasaka  A Ohnishi
Abstract:A calculation method for the incident angle dependence of the solar absorptance agrS and the temperature dependence of the total hemispherical emittance epsiH of multilayer films is proposed. The method is based on calculation of agrS and epsiH from optical constants in the wavelength region from 0.25 to 100 mgrm for thin polymer films and deposited metal. In this paper we provide values of agrS in the incident angle region from 0 to 90° and epsiH in the temperature range from 173.15 to 373.15 K for two-layer samples of aluminum-deposited polyimide film. The results obtained for agrS and epsiH by the present method are compared with experimental results measured by both spectroscopic and calorimetric methods. The calculated results of agrS and epsiH agree well with the experimental results.
Keywords:multilayer films  optical constants  reflectance  total hemispherical emittance  solar absorptance
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