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用透射反射扫描法检测光学薄膜的激光损伤
引用本文:甘荣兵,林理彬,蒋晓东,黄祖鑫,钟伟,郑万国,叶琳. 用透射反射扫描法检测光学薄膜的激光损伤[J]. 强激光与粒子束, 2002, 14(1): 45-48
作者姓名:甘荣兵  林理彬  蒋晓东  黄祖鑫  钟伟  郑万国  叶琳
作者单位:1. 四川大学 辐射物理及技术教育部重点实验室, 四川 成都 610064;2. 中国工程物理研究院 激光聚变研究中心, 四川 绵阳 621900
基金项目:国家 8 6 3激光技术领域资助课题
摘    要: 用波长1.06μm的激光透射反射自动扫描装置扫描了激光辐照前后薄膜的反射比和透射比。薄膜样品的工作波长为1.06μm。将扫描结果与相衬显微镜观察到的形貌相对照。实验结果表明,用透射反射扫描法不仅能反映出相衬显微镜所能观察到的损伤,而且也能发现某些显微镜所不能发现的损伤。由于透射比和反射比可以反映出薄膜对激光的传输性能,因此也能反映出薄膜能否继续工作,以此来判定损伤与否。因此用透射反射扫描法可以作为检测损伤的手段,由于简单易行,可以在线检测。避免目前损伤测试工作中繁重的人工操作。

关 键 词:激光损伤  光学薄膜  扫描  损伤阈值
文章编号:1001-4322(2002)01-0045-04
收稿时间:2001-06-21
修稿时间:2001-06-21

Determinant of laser-induced-damage of thin film by the scan of transmission and reflectance
GAN Rong-bing ,,LIN Li-bin ,JIANG Xiao-dong ,HUANG Zu-xin ,ZHONG Wei ,ZHENG Wan-guo ,YE Lin. Determinant of laser-induced-damage of thin film by the scan of transmission and reflectance[J]. High Power Laser and Particle Beams, 2002, 14(1): 45-48
Authors:GAN Rong-bing     LIN Li-bin   JIANG Xiao-dong   HUANG Zu-xin   ZHONG Wei   ZHENG Wan-guo   YE Lin
Affiliation:. Key Laboratory of Radiation Physics and Technology of Ministry of Education, Chengdu 610064, China;2. Research Center of Laser Fusion, CAEP, P.O.Box 919-988, Mianyang 621900, China
Abstract:The transmission and reflectance of optical thin film were tested using the scan facility at 1.06μm. Scan lines were drawn from the experimental data. The scan lines of two kinds of thin film were analyzed. By using the method, the first kind of damage which is obvious by microscope could be detected accurately, some of the second kind of damage which is not obvious by microscope could also be found. The comparison between scan results and microscope observation shows that the scan method is of higher sensitivity. The reason why the scan method is more sensitive than microscope was discussed. As it is easy to establish the facility, it can be used for online test.
Keywords:laser-induced damage  optic thin film  scan  damage threshold
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