| 基于安全控制边界单元的IP核测试封装方法 |
| |
| 引用本文： | 俞洋,向刚,乔立岩.基于安全控制边界单元的IP核测试封装方法[J].电子学报,2011,39(Z1):99-103. |
| |
| 作者姓名： | 俞洋 向刚 乔立岩 |
| |
| 作者单位： | 哈尔滨工业大学自动化测试与控制系,黑龙江哈尔滨,150001 |
| |
| 基金项目： | 装备预研重点基金，航天支撑基金 |
| |
| 摘 要： | 为了解决测试信息传递的问题,IEEE组织推出了IEEE1500 IP(Intellectual Property)核测试封装标准以标准化口核测试接口.然而该标准给出的典型测试封装存在由测试数据扫描移人造成的不安全隐患.本文提出了一种基于安全控制边界单元的IP核测试封装方法.这种方法的核心思想是在典型的测试封装边界单元的...
|
| 关 键 词： | 系统芯片 IEEE 1500标准 测试封装 传输门 |
Secure Test Wrapper Design for Embedded IP Cores |
| |
| YU Yang,XIANG Gang,QIAO Li-yan.Secure Test Wrapper Design for Embedded IP Cores[J].Acta Electronica Sinica,2011,39(Z1):99-103. |
| |
| Authors: | YU Yang XIANG Gang QIAO Li-yan |
| |
| Affiliation: | YU Yang,XIANG Gang,QIAO Li-yan(Department of Automatic Test and Control,Harbin Institute of Technology,Harbin,Heilongjiang 150001,China) |
| |
| Abstract: | The IEEE 1500 standard was proposed to standardize the IP(Intellectual Property) core test interface to transfer test information.But the typical IEEE 1500-compliant test wrapper would lead IP cores into an insecure status during scan shifting.This paper presented a secure test wrapper design for embedded IP cores,which only inserted a CMOS(Complementary Metal Oxide Semiconductor) transmission gate to the test wrapper cell to eliminate the precarious effect to IP cores.Experiments show that the proposed tes... |
| |
| Keywords: | system-on-a-chip IEEE 1500 standard test wrapper transmission gate |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
