基于ATPG的无线接入芯片的可测试性设计

可测试性设计是现代芯片设计中的关键环节,针对无线接入芯片的可测试性设计对测试技术有更高的要求。首先概述可测试性设计和测试向量自动生成理论,然后采用最新的测试向量自动生成技术,根据自行设计的无线接入芯片的内部结构及特点,建立一套无线接入芯片可测试性设计的方案。同时功能测试向量的配合使用,使得设计更为可靠。最终以最简单灵活的方法实现了该芯片的可测试性设计。

Testability Design of Wireless Chip Based on ATPG

Design for test is an important process in the chip design nowadays,testability design of wireless chip needs a much higher requirement of test technology.Design for test and automatic test-pattern generation technology is first introduced in this paper,then based on the internal structure and character of wireless chip,the advanced automatic test-pattern generation technology is used in the design to build a scheme of testability chip.Functional test-pattern is used simultaneity to make the design more available.Finally,the most simply and agilely method is used to implement the design.