Check size tuning of the pattern electroretingoram: a reappraisal |
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Authors: | Michael Bach Graham E Holder |
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Affiliation: | 1. Elektrophysiologisches Labor, Universit?ts-Augenklinik, Killinstr., 5, D-79106, Freiburg, Germany 2. Electrodiagnostic Department, Moorfields Eye Hospital, London, UK
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Abstract: | The pattern electroretinogram was recorded to checkerboard stimuli with a wide range of check sizes and two stimulus field
sizes. Check sizes ranged from 0.25° to 7° (field size, 16°×14°) and 0.25° to 15° (field size, 32°×27°) in 14 and seven subjects,
respectively. Reversal rate was 4.5/s. For minimal intrusion of blink artifacts the interrupted stimulation technique was
employed. The P50 and N95 components of the pattern electroretinogram were evaluated separately. With both stimulus field
sizes amplitude of P50 and N95 was maximal between 0.75° and 1°. With smaller check sizes the amplitude dropped monotonically.
With larger check sizes field size played a role: with the 16°×14° field, P50 gradually dropped to 89% from 1° to 7°, which
was paralleled by N95 only up to 7°, where N95 dropped to 81% (p<0.05). With the 32°×27° field, there was no significant difference in size dependency between P50 and N95 for large checks,
both components staying constant from 1° to 15° We conclude that there is only minor large-check attenuation of the pattern
electroretinogram, especially with a large field. The apparent field-size dependency may explain previous discrepancies in
the literature. |
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Keywords: | Check-size Pattern ERG PERG Spatial frequency Tuning |
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